Failure mechanisms data analysis during tension of additively manufactured Ti-6Al-4V alloy reinforced with nano-zirconia particles: Investigations of the crack path.

The data presented here aim to show how to analyze crack propagation of a novel metallic matrix composite of Ti-6Al-4V reinforced with 1 wt.% nano-yttria-stabilized zirconia processed by laser powder bed fusion technology. The data was acquired via microstructural observations and electron backscatter diffraction (EBSD) analyses after the quasistatic tensile tests at room temperature. The overall crack path configuration based on the fracture surface observation by scanning electron microscopy (SEM) was first operated, presenting two main regions: (i) local inclined planes (hereafter denoted as "stair-like"), and (ii) region in accordance with the theoretical mode I fracture plane. Thereafter, a series of EBSD data set on a surface obtained after longitudinal cut off operation on one failed piece was conducted at three distinct positions: (i) in the stair-like configuration region, (ii) in the mode I fracture region, and (iii) in the region where the crack path made his transition between these two mechanisms. Since the EBSD data sets were not prone to any post-processing filtering operation, comparison of the observed mechanism with other Ti-6Al-4V alloy processed by additive manufacturing (AM) technology can be easily carried out.

Data related to spectrum analyzes for phases identification, microstructure and mechanical properties of additive manufactured Ti6Al4V reinforced with nano Yttria stabilized zirconia.

Ti6Al4V reinforced by nano yttria-stabilized zirconia (nYSZ) addition parts were manufactured via selective laser additive manufacturing. A research paper entitled "Effect of nano-yttria stabilized zirconia addition on the microstructure and mechanical properties of Ti6Al4V parts manufactured by selective laser melting" [1] discuss the microstructure and mechanical properties relationships. This data paper presents the analytical elements used to perform Rietveld refinement using X-ray diffraction data (XRD) obtained on manufactured parts in order to uncover microstructure characteristics (phase, crystallographic texture, lattice parameters, crystallite size, etc.). The XRD data are complemented by grains size/shape estimation and description obtained by Electron Backscattered Diffraction (EBSD).